XRD AND SEM STUDIES OF REACTIVELY DEPOSITED TIN OXIDE THIN-FILMS

  • Year : 1995 Author : ABRAHAM, JT; KOSHY, P; VAIDYAN, VK; MUKHERJEE, PS; GURUSWAMY, P; KUMARI, LP
  • Research Area :Materials Science and Technology Journal : BULLETIN OF MATERIALS SCIENCE
  • Acesss :Open Access
  • DOI :10.1007/BF02744841
  • Publication Date :