In situ X-ray topographic study of sweeping of impurity ions in quartz crystals | NIIST

In situ X-ray topographic study of sweeping of impurity ions in quartz crystals

Year : 1999 लेखक : Sebastian, MT; Becker, RA; Klapper, H
Research Area :Materials Science and Technology Journal : JAPANESE JOURNAL OF APPLIED PHYSICS
DOI :10.1143/JJAP.38.4142
Publication Date :04/04/2023 - 11:04